4.5 Article

Intrinsic and extrinsic dopings in epitaxial films MnBi2Te4

Journal

JOURNAL OF PHYSICS-CONDENSED MATTER
Volume 35, Issue 29, Pages -

Publisher

IOP Publishing Ltd
DOI: 10.1088/1361-648X/accd39

Keywords

molecular beam epitaxy; magnetic topological insulator; doping effect

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This study investigates the effects of intrinsic and extrinsic doping on MnBi2Te4 epitaxial films and demonstrates the role of surface epitaxy in optimizing crystalline quality and defect engineering. Intrinsic antisite defects can be used to tune the Fermi level position, while extrinsic Sb doping compensates for this effect and modifies the magnetism and topology of the film, leading to a topological phase transition.
The intrinsic antiferromagnetic topological insulator MnBi2Te4 and members of its family have been the subject of theoretical and experimental research, which has revealed the presence of a variety of defects and disorders that are crucial in determining the topological and magnetic properties. This also brings about challenges in realizing the quantum states like the quantum anomalous Hall and the axion insulator states. Here, utilizing cryogenic magnetoelectric transport and magnetic measurements, we systematically investigate the effects arising from intrinsic doping by antisite defects and extrinsic doping by Sb in MnBi2Te4 epitaxial films grown by molecular beam epitaxy. We demonstrate that the nonequilibrium condition in epitaxy allows a wide growth window for optimizing the crystalline quality and defect engineering. While the intrinsic antisite defects caused by the intermixing between Bi and Mn can be utilized to tune the Fermi level position as evidenced by a p-to-n conductivity transition, the extrinsic Sb-doping not only compensates for this doping effect but also modifies the magnetism and topology of the film, during which a topological phase transition is developed. Conflicting reports from the theoretical calculations and experimental measurements in bulk crystals versus epitaxial films are addressed, which highlights the intimate correlation between the magnetism and topology as well as the balance between the Fermi-level positioning and defect control. The present study provides an experimental support for the epitaxial growth of the intrinsic topological insulator and underlines that the topology, magnetism, and defect engineering should be revisited for enabling a steady and reliable film production.

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