Journal
JOURNAL OF PHYSICAL CHEMISTRY LETTERS
Volume 14, Issue 7, Pages 1999-2005Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acs.jpclett.2c03585
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Understanding the spatial dynamics of nanoscale exciton transport is crucial for improving nanostructured optoelectronic devices. By using spatiotemporally resolved photoluminescence microscopy, we directly track diffusion and accurately determine the diffusion coefficient of the nonfullerene electron acceptor Y6, which provides valuable information for further studies on exciton dynamics in energy materials.
Understanding the spatial dynamics of nanoscale exciton transport beyond the temporal decay is essential for further improvements of nanostructured optoelectronic devices, such as solar cells. The diffusion coefficient (D) of the nonfullerene electron acceptor Y6 has so far only been determined indirectly, from singlet-singlet annihilation (SSA) experiments. Here, we present the full picture of the exciton dynamics, adding the spatial domain to the temporal one, by spatiotemporally resolved photoluminescence microscopy. In this way, we directly track diffusion and we are able to decouple the real spatial broadening from its overestimation given by SSA. We measured the diffusion coefficient, D = 0.017 +/- 0.003 cm2/s, which gives a Y6 film diffusion length of L = D 35 nm. Thus, we provide an essential tool that enables a direct and free-of-artifacts determination of diffusion coefficients, which we expect to be pivotal for further studies on exciton dynamics in energy materials.
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