Journal
ADVANCED MATERIALS
Volume 28, Issue 5, Pages 905-909Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.201504045
Keywords
grain boundary scattering; nanowire networks; solution-based processes; imprint lithography; transparent electrodes
Categories
Funding
- Nederlandse Organisatie voor Wetenschappelijk Onderzoek (NWO)
- European Research Council under the European Union [337328, 267634]
- European Research Council (ERC) [337328, 267634] Funding Source: European Research Council (ERC)