Synthesis of Zn-doped lead sulphide by electrodeposition: potential change on structural, morphological, and optical properties

PbS and Zn-doped PbS materials, which have many fields of study, stand out with their applications in electro-optic technology. In this study, pure, 2%, and 4% Zn-doped PbS films annealed at 250 degrees C annealing temperature were produced on Indium Tin Oxide substrates by electrodeposition method. Structural, optical, and morphological properties of these produced films were examined by broad range analysis methods, and the effect of Zn element doped for various rates on the films was reported. From the structural features of the films specified by X-ray diffraction, it was concluded that all of the films were in polycrystalline structure. The thickness of the films and the parameters defining some optical properties (extinction coefficient and refractive index) were stated by spectroscopic ellipsometer. The thickness values ranged between 245 and 232 nm. According to the measurements determined by the optical method, it was found that the optical band gaps of all the films were between 1.95 eV and 2.07 eV. The transmittance values of the films at the visible wavelength (400-700 nm) were determined as low. The surface morphologies and elemental analyses of the films were obtained by Scanning Electron Microscopy and Energy-Dispersive X-ray Spectroscopy, respectively. As a result of the investigations, it was concluded that the Zn dopant had a healing effect on the structural, optical, and surface properties of the films.

Automated summary

In this study, PbS and Zn-doped PbS films were electrodeposited on ITO substrates and analyzed for their structural, optical, and morphological properties. X-ray diffraction revealed that all films had a polycrystalline structure. The thickness of the films and their optical properties were determined using spectroscopic ellipsometry, with thickness values ranging from 245 nm to 232 nm and optical band gaps between 1.95 eV and 2.07 eV. Scanning Electron Microscopy and Energy-Dispersive X-ray Spectroscopy provided surface morphologies and elemental analyses of the films, respectively. The investigation concluded that Zn doping had a healing effect on the films' structural, optical, and surface properties.