4.7 Article

Transparent and high-performance electromagnetic interference shielding composite film based on single-crystal graphene/hexagonal boron nitride heterostructure

Journal

JOURNAL OF COLLOID AND INTERFACE SCIENCE
Volume 640, Issue -, Pages 610-618

Publisher

ACADEMIC PRESS INC ELSEVIER SCIENCE
DOI: 10.1016/j.jcis.2023.02.115

Keywords

Graphene; h-BN; Heterostructure; Transparent; EMI shielding

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This study successfully prepares transparent EMI shielding films with weak secondary reflection, nanoscale ultra-thin thickness, and long-term stability by using high-quality SCG/h-BN heterostructure. The shielding film, adopting SCG as the absorption layer and silver nanowires film as the reflection layer, achieves the dual coupling effect and enhances the absorption loss of electromagnetic waves. This research provides an outstanding EMI shielding material with great potential for practical applications in electronic devices protection.
The multiple requirements of optical transmittance, high shielding effectiveness, and long-term stability bring considerable challenge to electromagnetic interference (EMI) shielding in the fields of visualization windows, transparent optoelectronic devices, and aerospace equipment. To this end, attempts were hereby made, and based on high-quality single crystal graphene (SCG)/hexagonal boron nitride (h-BN) heterostructure, transparent EMI shielding films with weak secondary reflection, nanoscale ultra-thin thickness and long-term stability were finally realized by a composite structure. In this novel structure, SCG was adopted as the absorption layer, while sliver nanowires (Ag NWs) film acted as the reflection layer. These two layers were placed on different sides of the quartz to form a cavity, which achieved the dual coupling effect, so that the electromagnetic wave was reflected multiple times to form more absorption loss. Among the absorption dominant shielding films, the composite structure in this work demonstrated stronger shielding effectiveness of 28.76 dB with a higher light transmittance of 80.6%. In addition, under the protection of the outermost h-BN layer, the decline range of the shielding perfor-mance of the shielding film was extensively reduced after 30 days of exposure to air and maintained long-term stability. Overall, this study provides an outstanding EMI shielding material with great poten-tial for practical applications in electronic devices protection.(c) 2023 Elsevier Inc. All rights reserved.

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