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JOURNAL OF APPLIED PHYSICS
Volume 133, Issue 18, Pages -Publisher
AIP Publishing
DOI: 10.1063/5.0142766
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We investigated the impact of high-temperature Mg-implantation on the distribution of Mg-enriched defects in GaN layers. By using scanning transmission electron microscopy and atom probe tomography, we observed fewer Mg-enriched defects in the sample implanted at 1000℃ compared to the sample implanted at room temperature. The implantation of Mg ions at 1000℃ resulted in more uniform and enhanced donor-acceptor pair emission, leading to higher Mg activation.
We have investigated the impact of high-temperature Mg-implantation in GaN layers on distribution of Mg-enriched defects using scanning transmission electron microscopy and atom probe tomography. For this, 1 x 10(19) cm(-3) Mg ions have been implanted in GaN layers at room temperature (RT) and 1000 ?, followed by annealing at 1300 ?. A smaller number of Mg-enriched defects were observed in the sample implanted at 1000 ? in comparison to the sample implanted at RT. The implantation of Mg ions at 1000 ? resulted in a higher amount of randomly distributed Mg in the GaN matrix, which, in turn, leads to more uniform and enhanced donor-acceptor pair emission, leading to higher Mg activation.
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