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JOURNAL OF APPLIED PHYSICS
Volume 133, Issue 10, Pages -Publisher
AIP Publishing
DOI: 10.1063/5.0143083
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Graphene layers placed on SrTiO3 single-crystal substrates were investigated using temperature-dependent confocal Raman spectroscopy. This approach successfully resolved distinct Raman modes of graphene that are often difficult to trace in conventional measurements. Information on defects and strain states was obtained for graphene/SrTiO3 samples synthesized by different techniques. This confocal Raman spectroscopy can be applied not only to the graphene/SrTiO3 system but also to various two-dimensional layered materials with interfering Raman modes.
Graphene layers placed on SrTiO3 single-crystal substrates, i.e., templates for remote epitaxy of functional oxide membranes, were investigated using temperature-dependent confocal Raman spectroscopy. This approach successfully resolved distinct Raman modes of graphene that are often untraceable in conventional measurements with non-confocal optics due to the strong Raman scattering background of SrTiO3. Information on defects and strain states was obtained for a few graphene/SrTiO3 samples that were synthesized by different techniques. This confocal Raman spectroscopic approach can shed light on the investigation of not only this graphene/SrTiO3 system but also various two-dimensional layered materials whose Raman modes interfere with their substrates.
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