4.5 Article

Fast Neutron Irradiation on GaN-Based Light-Emitting Diodes From Near-Ultraviolet to Green Spectral Ranges

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 70, Issue 4, Pages 686-693

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2023.3260859

Keywords

Light emitting diodes; Neutrons; Radiation effects; Quantum well devices; Stimulated emission; Power generation; Optical sensors; Carrier block layer; carrier injection; GaN; light-emitting diodes (LEDs); neutron irradiation

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Neutron irradiation effects on GaN-based multiquantum well light-emitting diodes (LEDs) with different emission wavelengths were studied. The optical output power, current-voltage characteristics, and peak wavelength were analyzed before and after irradiation. The increase in optical output power of the LEDs was attributed to the increase in carrier injection, but the degradation in performance was mainly caused by the formation of tunneling conductivity channels in the electron block layer induced by neutrons. Among the three colors of LEDs, green LEDs were the most severely affected due to their poor carrier confinement in shallow GaN/AlGaN MQWs.
Neutron irradiation effects were compared for GaN-based multiquantum well (MQW) light-emitting diodes (LEDs) with emission wavelength in the near-ultraviolet (NUV), blue, and green spectral regions. Optical output power, text current-voltage (I - V), and peak wavelength were analyzed in detail before and after irradiation. Three colors of LEDs showed an increase and then a decrease in optical output power with the increase of neutron fluence ranging from 1.0 x 10(12) to 1.0 x 10(14) cm(-2) . The enhanced light emission performance is attributed to the increase of carrier injection for neutron-irradiated MQWs. In addition, the formation of tunneling conductivity channels in the p-doped AlGaN electron block layer (EBL) induced by neutrons is considered as the main factor that dominates the performance degradation. Among the three colors of LEDs, the order of severity for the optical and electrical properties influenced by this medium-fluence neutron irradiation is green, blue, and NUV LEDs, in turn becoming more serious. The NUV LEDs rely heavily on the EBL due to their poor carrier confinement in relatively shallow GaN/AlGaN MQWs, so an increase of carrier injection or leakage induced by neutrons has a significant influence on device performance. As the green LEDs have deep quantum wells, the strong confinement of carriers leads to their being least sensitive to neutron irradiation. Thus, we believe that the design of LEDs with deep quantum wells to enhance the carrier confinement ability will be helpful to improve their radiation tolerance. The findings not only enrich the understanding of the influence mechanism of neutron-irradiated GaN-based UV/visible LEDs but are also helpful to radiation-hardened design.

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