4.6 Article

Record RF Power Performance at 94 GHz From Millimeter-Wave N-Polar GaN-on-Sapphire Deep-Recess HEMTs

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 70, Issue 4, Pages 2075-2080

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2023.3240683

Keywords

Logic gates; HEMTs; MODFETs; Gallium nitride; Passivation; Performance evaluation; Dispersion; Efficiency; gain; GaN-on-sapphire; high-electron-mobility transistor (HEMT); millimeter-wave; N-polar

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This article presents breakthrough N-polar GaN-on-sapphire deep-recess metal-insulator-semiconductor (MIS)-high-electron-mobility transistors (HEMTs) with outstanding performance at W-band. The use of a thin GaN cap layer, atomic layer deposition (ALD) ruthenium (Ru) gate metallization, and high-quality GaN-on-sapphire epitaxy contributes to the excellent power performance achieved. The N-polar GaN-on-sapphire technology shows great potential for millimeter-wave power amplifier applications with high efficiency and power density.
In this article, N-polar GaN-on-sapphire deep-recess metal-insulator-semiconductor (MIS)-high-electron-mobility transistors (HEMTs) with a breakthrough performance at $\textit{W}$ -band are presented. Compared with prior N-polar GaN MIS-HEMTs, a thin GaN cap layer and atomic layer deposition (ALD) ruthenium (Ru) gate metallization were used along with high-quality GaN-on-sapphire epitaxy from Transphorm Inc. Before SiN passivation, 94 GHz large signal load-pull shows that the transistor obtains a record-high 9.65 dB linear transducer gain and demonstrated 42% power-added efficiency (PAE) with associated 4.4 W/mm of output power density at 12 V drain bias. By biasing the drain at 8 V, the device shows an even higher PAE of 44% with an associated 2.6 W/mm of output power density. After SiN passivation, the fabricated N-polar GaN-on-sapphire HEMTs show a high PAE of 40.2% with an associated 4.85 W/mm of output power density. Furthermore, a very high output power density of 5.83 W/mm with 38.5% PAE is demonstrated at a 14 V drain bias. This power performance shows significant efficiency improvement over previous N-polar GaN-on-SiC and demonstrates a combined efficiency and power density beyond what has been reported for Ga-polar devices, in spite of the low-thermal-conductivity sapphire substrate. This shows that N-polar GaN-on-sapphire technology is an attractive candidate for millimeter-wave power amplifier applications with simultaneous high efficiency and power density.

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