Related references
Note: Only part of the references are listed.Advanced hybrid process with back contact IGZO-TFT
Masatomo Honjo et al.
JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY (2022)
Reliability improvement of IGZO-TFT in hybrid process with LTPS
Mehadi Aman et al.
JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY (2021)
Unintended Carbon-Related Impurity and Negative Bias Instability in High-Mobility Oxide TFTs
Yu-Shien Shiah et al.
IEEE ELECTRON DEVICE LETTERS (2021)
Unique degradation under AC stress in high-mobility amorphous In-W-Zn-O thin-film transistors
Takanori Takahashi et al.
APPLIED PHYSICS EXPRESS (2020)
Automotive OLED Display with High Mobility Top Gate IGZO TFT Backplane
Yujiro Takeda et al.
ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2020)
Device modeling of amorphous oxide semiconductor TFTs
Katsumi Abe et al.
JAPANESE JOURNAL OF APPLIED PHYSICS (2019)
Hot carrier effects in InGaZnO thin-film transistor
Takanori Takahashi et al.
APPLIED PHYSICS EXPRESS (2019)
Electronic Defects in Amorphous Oxide Semiconductors: A Review
Keisuke Ide et al.
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE (2019)
Development of 55 4K UHD OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs
Ji Yong Noh et al.
JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY (2018)
Analysis of Improved Performance Under Negative Bias Illumination Stress of Dual Gate Driving a-IGZO TFT by TCAD Simulation
Mohammad Masum Billah et al.
IEEE ELECTRON DEVICE LETTERS (2016)
Amorphous IGZO Thin-Film Transistors With Ultrathin Channel Layers
Tsung-Han Chiang et al.
IEEE TRANSACTIONS ON ELECTRON DEVICES (2015)
Investigation on stress induced hump phenomenon in IGZO thin film transistors under negative bias stress and illumination
Dae Hyun Kim et al.
MICROELECTRONICS RELIABILITY (2015)
Reduction of Negative Bias and Light Instability of a-IGZO TFTs by Dual-Gate Driving
Sejin Hong et al.
IEEE ELECTRON DEVICE LETTERS (2014)
Advanced technologies for UHD curved OLED TV
Chang-Wook Han et al.
JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY (2014)
Quantitative Analysis of Hole-Trapping and Defect-Creation in InGaZnO Thin-Film Transistor under Negative-Bias and Illumination-Stress
Mai Phi Hung et al.
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY (2014)
Negative Bias and Illumination Stress Induced Electron Trapping at Back-Channel Interface of InGaZnO Thin-Film Transistor
Mai Phi Hung et al.
ECS SOLID STATE LETTERS (2014)
Bulk Accumulation a-IGZO TFT for High Current and Turn-On Voltage Uniformity
Mallory Mativenga et al.
IEEE ELECTRON DEVICE LETTERS (2013)
Light/negative bias stress instabilities in indium gallium zinc oxide thin film transistors explained by creation of a double donor
Piero Migliorato et al.
APPLIED PHYSICS LETTERS (2012)
Amorphous In-Ga-Zn-O Dual-Gate TFTs: Current-Voltage Characteristics and Electrical Stress Instabilities
Katsumi Abe et al.
IEEE TRANSACTIONS ON ELECTRON DEVICES (2012)
Highly stable amorphous In-Ga-Zn-O thin-film transistors produced by eliminating deep subgap defects
Kenji Nomura et al.
APPLIED PHYSICS LETTERS (2011)
Electrical Properties and Stability of Dual-Gate Coplanar Homojunction DC Sputtered Amorphous Indium-Gallium-Zinc-Oxide Thin-Film Transistors and Its Application to AM-OLEDs
Gwanghyeon Baek et al.
IEEE TRANSACTIONS ON ELECTRON DEVICES (2011)
Light induced instabilities in amorphous indium-gallium-zinc-oxide thin-film transistors
Md Delwar Hossain Chowdhury et al.
APPLIED PHYSICS LETTERS (2010)
Present status of amorphous In-Ga-Zn-O thin-film transistors
Toshio Kamiya et al.
SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS (2010)
Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors
Jae Kyeong Jeong et al.
APPLIED PHYSICS LETTERS (2008)
Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors
A. Suresh et al.
APPLIED PHYSICS LETTERS (2008)
Amorphous oxide semiconductors for high-performance flexible thin-film transistors
Kenji Nomura et al.
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS (2006)
Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors
K Nomura et al.
NATURE (2004)