Journal
IEEE ELECTRON DEVICE LETTERS
Volume 44, Issue 5, Pages 805-808Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2023.3262000
Keywords
Signal fluctuation limit; BLIP limit; ultraviolet photodetectors; photogating effect
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In recent years, there has been significant progress in improving the performance of ultraviolet detectors, surpassing the physical limit of detection determined by signal fluctuations. This is particularly evident in Ga2O3 phototransistors and a new generation of photodetectors containing low-dimensional solids. The purpose of this letter is to highlight cases of overestimation of ultraviolet detector performance noted by the author and draw attention to their fundamental physical limitations overlooked in detector characterization.
Over the past few years, the available literature shows signaled great progress in improving the performance of ultraviolet detectors, even exceeding the physical limit of detection determined by signal fluctuations. This is particularly true for Ga2O3 phototransistors and a new generation of photodetectors with active areas containing low-dimensional solids. The purpose of this letter is to show cases of overestimation of the performance of ultraviolet detectors noted by the author and to draw attention to their fundamental physical limitations which are overlooked in the characterization of detectors.
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