Journal
CERAMICS INTERNATIONAL
Volume 41, Issue 2, Pages 2381-2388Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2014.10.052
Keywords
Electron microscopy; Spectroscopy; X-ray methods; Optical properties; ZnO
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Funding
- Romanian Authority for Scientific Research-UEFISCDI [PN-II-RU-PD-2012-3-0124]
- European Commission [NMP3-SL-2010-246073]
- Microscopy Service and Institute of Chemical Technology (ITQ)-Universidad Politecnica de Valencia
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Large areas of reduced graphene oxide (rGO) films were obtained by electrophoretic deposition onto insulating glass substrate. ZnO nanostructures were directly grown on the rGO films by single-step electrodeposition method. The properties of ZnO nanostructures were evaluated as a function of deposition mode onto rGO electrodes with different stoichiometry. Atomic force microscopy (AFM), X-ray diffraction (XRD), scanning electron microscopy (SEM), thermogravimetrical analysis (TGA), transmission measurements, Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) were employed to characterize the obtained materials. Bi-pod morphology was observed for ZnO electrodeposited on rGO films by pulsed current elelctrodeposition. The obtained ZnO/rGO hybrid structures show high potential for highly transparent optoelectronic nanodevices. (C) 2014 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
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