Journal
CERAMICS INTERNATIONAL
Volume 41, Issue 2, Pages 3214-3219Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2014.10.181
Keywords
Composites; Electrical properties; Substrates; Resistors
Categories
Funding
- National Natural Science Foundation of China [51202291]
- Aid Program for Innovative Group of National University of Defense Technology
- Aid program for Science and Technology Innovative Research Team in Higher Educational Institutions of Hunan Province
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The microstructural and electrical properties of thick-film resistors (R-311-A, R-312-A and R-313-A, ESL) fired on oxide/oxide composites were investigated with the purpose of determining the compatibility of these resistor materials with the new substrates. Normally, these resistor materials were developed for firing on alumina ceramic. Possible interactions between the thick-film resistors and the substrates were studied by scanning electron microscopy and energy-dispersive X-ray analyses. The sheet resistivities and resistance temperature characteristic of the resistors fired on different substrates were measured. The results indicate that interactions between the alumina substrate and the resistor layer were not observed. However, at the interface between the composites (matrix) and the resistor layer an obvious transition layer is detected. In addition, the sheet resistivities on composites substrates are generally lower than that on alumina. Moreover, the resistors fired on alumina show a positive resistance temperature characteristic (TCR) from 25 degrees C to 500 degrees C, while the TCRs for the resistors fired on the composites substrates are negative. Microstructural analysis and thermal expansion coefficient testing show that the underlying substrate strongly influences the final characteristics of the resistors in two ways: through chemical interaction and thermal expansion. (C) 2014 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
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