L-shell x-ray fluorescence relative intensities for elements with 62 & LE; Z & LE; 83 at 18 keV and 23 keV by synchrotron radiation

The relative intensities of L-subshell x-ray fluorescence (XRF) for elements with atomic numbers 62 & LE; Z & LE; 83 were measured at two excitation energies, 18 keV and 23 keV, using a synchrotron radiation source at a beamline of the Synchrotron Light Center for Experimental Science and Applications in the Middle East (SESAME), Jordan. The experimentally measured results of the relative intensities were compared with the calculated results using the subshell fluorescence yield and the Coster-Kronig transition probabilities recommended by Campbell and the values based on the Dirac-Hartree-Slater model by Puri. The experimental and theoretical results are in agreement. In this work, L XRF relative intensities for the elements Sm, Gd, Tb, Er, Ta, W, Re, Hg, Pb and Bi at energies of 18 keV and 23 keV were measured.

Automated summary

In this study, the relative intensities of L-subshell x-ray fluorescence (XRF) for elements with atomic numbers 62≤Z≤83 were measured at two excitation energies, 18 keV and 23 keV, using a synchrotron radiation source at SESAME in Jordan. The experimental results were compared with theoretical calculations based on the subshell fluorescence yield and transition probabilities, and good agreement was found. This research also measured the L XRF relative intensities for specific elements at energies of 18 keV and 23 keV.