Journal
CHINA FOUNDRY
Volume 20, Issue 2, Pages 159-178Publisher
SPRINGER SINGAPORE PTE LTD
DOI: 10.1007/s41230-023-2103-9
Keywords
wide-bandgap semiconductor; silicon carbide; bulk growth of single crystal; process parameters
Categories
Ask authors/readers for more resources
Silicon carbide (SiC) is a wide-bandgap semiconductor with excellent inherent properties for high-power, high-frequency, and high-temperature devices. Solution growth has been favored for producing SiC single crystal ingots with low dislocation density and doping concentrations ranging from 10(14) to 10(19) cm(-3). Various techniques, such as solution growth on a concave surface, melt-back, accelerated crucible rotation technique, two-step growth, and facet growth, have been developed based on top-seeded solution growth. Multiple parameters, including meniscus, solvent design, flow control, dislocation conversion, facet growth, and graphite component structures, contribute to high-quality single crystal growth. This paper reviews the solution growth techniques and corresponding parameters in SiC bulk growth.
Silicon carbide (SiC), a group IV compound and wide-bandgap semiconductor for high-power, high-frequency and high-temperature devices, demonstrates excellent inherent properties for power devices and specialized high-end markets. Solution growth is thermodynamically favorable for producing SiC single crystal ingots with ultra-low dislocation density as the crystallization is driven by the supersaturation of carbon dissolved in Si-metal solvents. Meanwhile, solution growth is conducive to the growth of both N- and P-type SiC, with doping concentrations ranging from 10(14) to 10(19) cm(-3). To date, 4-inch 4H-SiC substrates with a thickness of 15 mm produced by solution growth have been unveiled, while substrates of 6 inches and above are still under development. Based on top-seeded solution growth (TSSG), several growth techniques have been developed including solution growth on a concave surface (SGCS), melt-back, accelerated crucible rotation technique (ACRT), two-step growth, and facet growth. Multi-parameters of the solution growth including meniscus, solvent design, flow control, dislocation conversion, facet growth, and structures of graphite components make high-quality single crystal growth possible. In this paper, the solution growth techniques and corresponding parameters involved in SiC bulk growth were reviewed.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available