Impact of iso-structural template layer on stabilizing pyrochlore Bi2Rh2O7

We present an epitaxial stabilization of pyrochlore Bi2Rh2O7 on the Y-stabilized ZrO2 (YSZ) (111) substrate by inserting a pyrochlore Eu2Ti2O7 template layer, otherwise Bi-based layered structures being formed directly on the YSZ (111) substrate. This result reveals that iso-structural crystal phase plays an important role in the interfacial phase control. The Bi2Rh2O7 film exhibits p-type electrical conduction with the lowest longitudinal resistivity (?(xx)) among the reported Rh pyrochlore oxides. Such parameters as ?(xx), carrier density, and mobility show almost no temperature dependence in the measured range of 2-300 K.

Automated summary

The research team successfully achieved the epitaxial stabilization of pyrochlore Bi2Rh2O7 on Y-stabilized ZrO2 (YSZ) (111) substrate by inserting a pyrochlore Eu2Ti2O7 template layer, instead of forming Bi-based layered structures directly on the YSZ (111) substrate. This study demonstrates the importance of iso-structural crystal phase in interfacial phase control. The Bi2Rh2O7 film exhibits p-type electrical conduction with the lowest longitudinal resistivity (?(xx)) among reported Rh pyrochlore oxides, and shows almost no temperature dependence in the measured range of 2-300 K for parameters such as ?(xx), carrier density, and mobility.