4.6 Article

Photoresponse application of the dip-coated Cu2ZnSnS4 thin film

Journal

Publisher

SPRINGER HEIDELBERG
DOI: 10.1007/s00339-023-06507-2

Keywords

Cu2ZnSnS4; Dip-coating; Thin films; Photoresponse

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In this study, Cu2ZnSnS4 (CZTS) thin films were prepared using the dip-coating technique and showed perfect stoichiometry and a tetragonal unit cell phase. Scanning electron microscopy and electron diffraction confirmed the uniformity and presence of fringes in the films, with fringe width matching the inter-planar spacing of the CZTS (112) major plane. The thin films exhibited a direct bandgap optical property with a value of 1.5 eV. Raman analysis confirmed the CZTS phase of the prepared thin films. The CZTS thin film/Ag-paste/Cu-wire combination had promising photoresponse potential for future applications.
The Cu2ZnSnS4 (CZTS) thin films are prepared by dip-coating technique. The prepared thin films showed perfect stoichiometry and phase with a tetragonal unit cell. The scanning electron microscopy of the surface and electron diffraction showed the uniform spread of the film with the presence of fringes, respectively. The fringe width matches the inter-planner spacing of the CZTS (112) major plane. The thin film showed an optical bandgap of direct nature having a value of 1.5 eV. The analysis by Raman confirmed the CZTS phase of the prepared thin film. The CZTS thin film/Ag-paste/Cu-wire combination is studied for photoresponse for three monochromatic incident photon wavelengths. The evaluated photoresponse parameters stated the as-prepared CZTS thin film has the potential for future applications.

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