4.5 Article

Synchrotron-based techniques for characterizing STCH water-splitting materials

Journal

FRONTIERS IN ENERGY RESEARCH
Volume 10, Issue -, Pages -

Publisher

FRONTIERS MEDIA SA
DOI: 10.3389/fenrg.2022.931364

Keywords

XAS; XRD; STCH; complex oxides; redox chemistry; thermochemical water splitting

Categories

Funding

  1. HydroGEN Advanced Water Splitting Materials Consortium, Energy Materials Network under the United States Department of Energy, Office of Energy Efficiency and Renewable Energy, Hydrogen and Fuel Cell Technologies Office [DE-EE0008087]
  2. Office of Science, Office of Basic Energy Sciences, of the United States Department of Energy [DEAC02-05CH11231]
  3. United States Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-AC02-76SF00515]
  4. Walter Ahlstrom Foundation
  5. European Union's Horizon 2020 research and innovation program under the Marie Sklodowska-Curie grant [841621]

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Understanding the role of oxygen vacancy-induced atomic and electronic structural changes during water-splitting processes is crucial for solar thermochemical hydrogen production. Synchrotron X-ray techniques, such as X-ray diffraction and absorption spectroscopy, provide valuable insights into the complex metal oxides' properties and behavior during water-splitting cycles.
Understanding the role of oxygen vacancy-induced atomic and electronic structural changes to complex metal oxides during water-splitting processes is paramount to advancing the field of solar thermochemical hydrogen production (STCH). The formulation and confirmation of a mechanism for these types of chemical reactions necessitate a multifaceted experimental approach, featuring advanced structural characterization methods. Synchrotron X-ray techniques are essential to the rapidly advancing field of STCH in part due to properties such as high brilliance, high coherence, and variable energy that provide sensitivity, resolution, and rapid data acquisition times required for the characterization of complex metal oxides during water-splitting cycles. X-ray diffraction (XRD) is commonly used for determining the structures and phase purity of new materials synthesized by solid-state techniques and monitoring the structural integrity of oxides during water-splitting processes (e.g., oxygen vacancy-induced lattice expansion). X-ray absorption spectroscopy (XAS) is an element-specific technique and is sensitive to local atomic and electronic changes encountered around metal coordination centers during redox. While in operando measurements are desirable, the experimental conditions required for such measurements (high temperatures, controlled oxygen partial pressures, and H2O) practically necessitate in situ measurements that do not meet all operating conditions or ex situ measurements. Here, we highlight the application of synchrotron X-ray scattering and spectroscopic techniques using both in situ and ex situ measurements, emphasizing the advantages and limitations of each method as they relate to water-splitting processes. The best practices are discussed for preparing quenched states of reduction and performing synchrotron measurements, which focus on XRD and XAS at soft (e.g., oxygen K-edge, transition metal L-edges, and lanthanide M-edges) and hard (e.g., transition metal K-edges and lanthanide L-edges) X-ray energies. The X-ray absorption spectra of these complex oxides are a convolution of multiple contributions with accurate interpretation being contingent on computational methods. The state-of-the-art methods are discussed that enable peak positions and intensities to be related to material electronic and structural properties. Through careful experimental design, these studies can elucidate complex structure-property relationships as they pertain to nonstoichiometric water splitting. A survey of modern approaches for the evaluation of water-splitting materials at synchrotron sources under various experimental conditions is provided, and available software for data analysis is discussed.

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