4.6 Article

A Semi-Supervised Inspection Approach of Textured Surface Defects under Limited Labeled Samples

Journal

COATINGS
Volume 12, Issue 11, Pages -

Publisher

MDPI
DOI: 10.3390/coatings12111707

Keywords

deep learning (DL); generative adversarial network (GAN); label assignment; semi-supervised learning

Funding

  1. SUT Youth Scientific Research Ability Cultivation Project [200005796]

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This study proposes a semi-supervised framework based on deep learning techniques for texture surface defect classification, utilizing generative adversarial networks and convolutional neural networks. A novel label assignment scheme is introduced to integrate unlabeled samples into semi-supervised learning for enhanced system performance.
Defect inspection is a key step in guaranteeing the surface quality of industrial products. Based on deep learning (DL) techniques, related methods are highly effective in defect classification tasks via a supervision process. However, collecting and labeling many defect samples are usually harsh and time-consuming processes, limiting the application of these supervised classifiers on various textured surfaces. This study proposes a semi-supervised framework, based on a generative adversarial network (GAN) and a convolutional neural network (CNN), to classify defects of a textured surface, while a novel label assignment scheme is proposed to integrate unlabeled samples into semi-supervised learning to enhance the overall performance of the system. In this framework, a customized GAN uses limited labeled samples to generate unlabeled ones, while the proposed label assignment scheme makes the generated data follow different label distributions in such a way that they can participate in training with labeled data. Finally, a CNN is proposed for semi-supervised training and the category identification of each defect sample. Experimental results show the effectiveness and robustness of the proposed framework even if original samples are limited. We verify our approach on four different surface defect datasets, achieving consistently competitive performances.

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