Comparison of Sputtered and Evaporated Vanadium Pentoxide Thin Films for Resistive Microbolometer Application

V2O5 thin films have made impressive progress in the development of resistive microbolometers. The challenging parameters for microbolometers are the active material selection and the deposition methods. It might be a more promising way to achieve a good performance of the devices. The present work deals with the V2O5 thin films fabricated on soda lime glass substrates by using e-beam evaporation and magnetron sputtering techniques at a substrate temperature of 200 degrees C. Afterward, samples were annealed at 300 and 400 degrees C for 1 h to obtain uniform and stoichiometric thin films. X-ray Diffraction (XRD) showed that the thin films deposited by magnetron sputtering were amorphous in nature, even after annealing at elevated temperatures; however, the thin films fabricated by the electron beam evaporation technique show crystalline nature, which was improved by annealing. XRD also revealed various mixed phases of VOx in electron beam-deposited films. Optical properties were determined using UV-Visible spectroscopy, which showed a decrease in transmittance from 81% down to 57% by increasing the annealing temperature. Similarly, the band gap calculated for electron beam evaporated and magnetron sputtered V2O5 thin films was observed in the range of 1.41 to 2.25 eV. Rutherford backscattering (RBS) was performed to determine the thickness and composition of the films. Slight variations have been observed in intended and deposited thicknesses of films fabricated by e-beam and sputtering techniques. Structural properties revealed by Field Emission Scanning Electron Microscope (FESEM) were found to be the uniform, compact and dense surface of the as-deposited and 300 degrees C annealed samples. However, annealing at 400 degrees C changed the surface morphology into nanorods in e-beam and plate-like structures in the sputtered film. EDS proved the elemental concentration of vanadium and oxygen in these V2O5 thin films. Electrical properties were investigated using the Hall measurement technique which showed better conductivity of sputtered films than e-beam deposited films. It can be concluded that the cost-effective and reliable microbolometers infrared (IR) sensors can be fabricated using annealed sputtered films.

Automated summary

V2O5 thin films were fabricated on soda lime glass substrates using e-beam evaporation and magnetron sputtering techniques at a substrate temperature of 200 degrees C. The thin films showed different structural, optical, and electrical properties depending on the deposition method. XRD, UV-Visible spectroscopy, RBS, FESEM, and Hall measurement techniques were used to characterize the films. The results showed that sputtered films had better crystallinity, optical properties, and conductivity compared to e-beam deposited films, making them suitable for the fabrication of cost-effective and reliable microbolometers infrared (IR) sensors.