Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 30, Issue -, Pages 468-478Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S160057752300019X
Keywords
X-ray photoelectron microscopy; ACLEEM; micro-ARPES; XMCD
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MAXPEEM is a dedicated photoemission electron microscopy beamline at MAX IV Laboratory, featuring an aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM). This powerful instrument offers a wide range of complementary techniques with a single-digit nanometer spatial resolution for structure, chemistry, and magnetic sensitivities. The beamline can deliver a high photon flux of >= 10(15) photons s(-1) (0.1% bandwidth)(-1) in the range 30-1200 eV, with full control of polarization.
MAXPEEM, a dedicated photoemission electron microscopy beamline at MAX IV Laboratory, houses a state-of-the-art aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM). This powerful instrument offers a wide range of complementary techniques providing structural, chemical and magnetic sensitivities with a single-digit nanometre spatial resolution. The beamline can deliver a high photon flux of >= 10(15) photons s(-1) (0.1% bandwidth)(-1) in the range 30-1200 eV with full control of the polarization from an elliptically polarized undulator. The microscope has several features which make it unique from similar instruments. The X-rays from the synchrotron pass through the first beam separator and impinge the surface at normal incidence. The microscope is equipped with an energy analyzer and an aberration corrector which improves both the resolution and the transmission compared with standard microscopes. A new fiber-coupled CMOS camera features an improved modulation transfer function, dynamic range and signal-to-noise ratio compared with the traditional MCP-CCD detection system.
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