4.6 Article

Incremental Testing in Software Product Lines-An Event Based Approach

Journal

IEEE ACCESS
Volume 11, Issue -, Pages 2384-2395

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/ACCESS.2023.3234186

Keywords

Test pattern generators; Software product lines; Software testing; Behavioral sciences; Computational modeling; Time complexity; Incremental testing; model-based testing; software product line

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One way to develop fast, effective, and high-quality software products is to reuse previously developed software components and products. The software product line (SPL) approach can make reuse more effective in the case of a product family. This paper proposes an incremental model-based approach to test products in SPLs by utilizing event-based behavioral models.
One way of developing fast, effective, and high-quality software products is to reuse previously developed software components and products. In the case of a product family, the software product line (SPL) approach can make reuse more effective. The goal of SPLs is faster development of low-cost and high-quality software products. This paper proposes an incremental model-based approach to test products in SPLs. The proposed approach utilizes event-based behavioral models of the SPL features. It reuses existing event-based feature models and event-based product models along with their test cases to generate test cases for each new product developed by adding a new feature to an existing product. Newly introduced featured event sequence graphs (FESGs) are used for behavioral feature and product modeling; thus, generated test cases are event sequences. The paper presents evaluations with three software product lines to validate the approach and analyze its characteristics by comparing it to the state-of-the-art ESG-based testing approach. Results show that the proposed incremental testing approach highly reuses the existing test sets as intended. Also, it is superior to the state-of-the-art approach in terms of fault detection effectiveness and test generation effort but inferior in terms of test set size and test execution effort.

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