Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling

ADVANCED MATERIALS

Volume 27, Issue 19, Pages 3002-3006

WILEY-V C H VERLAG GMBH

focused ion beam milling; molecular electronics; nanogap electrodes

Chemistry, Multidisciplinary Chemistry, Physical Nanoscience & Nanotechnology Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter

1. National Natural Science Foundation of China [51222306, 61390503, 91323304, 91222203, 91233205, 91433115]
2. China-Denmark Co-project [60911130231]
3. NSFC-DFG Transregio Project [TRR61]
4. Ministry of Science and Technology of China [2011CB808405, 2011CB932304, 2013CB933403, 2013CB933504]
5. Chinese Academy of Sciences [XDB12030300]
6. Beijing NOVA Programme [Z131101000413038]
7. Beijing Local College Innovation Team Improve Plan [IDHT20140512]