4.5 Article

Electroluminescence Analysis and Grading of Hail Damaged Solar Panels

Journal

IEEE JOURNAL OF PHOTOVOLTAICS
Volume 12, Issue 6, Pages 1308-1313

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2022.3206906

Keywords

Glass; Computer architecture; Testing; Microprocessors; Electric breakdown; Cameras; Solar panels; Electroluminescence; hail; UV fluorescence

Funding

  1. U.S. Department of Energy Sun Shot Initiative [DE-EE-0008155, DE-EE0008152]

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We analyzed over 4000 electroluminescence images of hail damaged solar panels and classified the defects into categories for insurance claims and resale pricing. The statistics can be useful for predicting invisible damage to solar systems.
We analyzed more than 4000 electroluminescence images of hail damaged solar panels from a cluster of houses in Texas. We enhanced the images for ease of analysis and classified the defects within each solar cell into categories of glass breakage, installer damage, inactive substrings, crack severity, interconnect wire problems, and whether the damage was likely caused by hail. From these statistics, we quantified each panel into five levels of hail damage for insurance claims, and four levels of overall quality for potential resale pricing. We share here some statistics regarding the defects with the hope that the data is useful to others attempting to predict the invisible damage to systems based just on the easily observable glass breakage statistics.

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