4.6 Article

Junction-Enhanced Polarization Sensitivity in Self-Powered Near-Infrared Photodetectors Based on Sb2Se3 Microbelt/n-GaN Heterojunction

Journal

ADVANCED OPTICAL MATERIALS
Volume 11, Issue 3, Pages -

Publisher

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adom.202202080

Keywords

anisotropic materials; near-infrared; polarization-sensitive detection; Sb2Se3; GaN heterojunction; self-powered photodetectors

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This study proposes a near-infrared photodetector based on a Sb2Se3 microbelt/n-GaN heterojunction, which exhibits high responsivity and specific detectivity, as well as a higher anisotropy ratio. The research not only provides insights into the polarization sensitivity regulated by junction or interface, but also offers a practical method for developing high-sensitivity polarization detectors based on high-thickness or bulk anisotropic materials.
Polarization-sensitive photodetectors (PDs) based on anisotropic materials spark considerable interest for their potential applications in security surveillance, optical switches, and remote sensing. However, high-thickness or bulk anisotropic materials generally exhibit low polarization sensitivity, hindering their practical applications in polarization photodetection. Herein, a near-infrared (NIR) PD based on a p-type Sb2Se3 microbelt (MB)/n-GaN heterojunction is proposed. The Sb2Se3 MB/GaN PD effectively combines the anisotropy of the Sb2Se3 MB with the heterogeneous integration. The PD presents self-powered detection properties with a responsivity over 12 mA W-1, a specific detectivity exceeding 5 x 10(10) Jones, and a response speed (the rising/decaying times approximate to 74 ms/75 ms) under NIR illumination. More importantly, the heterojunction-based PD has a higher anisotropy ratio of 1.37, which is 1.3 times amplified as compared to the vertical photoconductive-type PDs (the anisotropy ratio of 1.06). The p-n junction's effect on carrier generation and recombination causes the increased polarization sensitivity of Sb2Se3 MB/GaN PDs, as confirmed by finite element method analysis. This work not only offers a deeper insight into polarization sensitivity regulated by junction or interface but also provides a practical method for developing high-sensitivity polarization detectors based on high-thickness or bulk anisotropic materials.

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