4.7 Article

A Supervised Learning Algorithm for Multilayer Spiking Neural Networks Based on Temporal Coding Toward Energy-Efficient VLSI Processor Design

Journal

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNNLS.2021.3095068

Keywords

Encoding; Neurons; Very large scale integration; Task analysis; Nonhomogeneous media; Timing; Supervised learning; Edge computing; spiking neural network (SNN); supervised learning; temporal coding; very-large-scale integration (VLSI)

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This article proposes a novel supervised learning algorithm for SNNs based on temporal coding, which can be implemented using analog resistive memory for high energy efficiency. The algorithm shows comparable classification accuracy to state-of-the-art temporal coding SNN algorithms on MNIST and Fashion-MNIST datasets. The robustness of the proposed SNNs against variations in the manufacturing process is also discussed, along with a technique to suppress the effects of these variations on recognition performance.
Spiking neural networks (SNNs) are brain-inspired mathematical models with the ability to process information in the form of spikes. SNNs are expected to provide not only new machine-learning algorithms but also energy-efficient computational models when implemented in very-large-scale integration (VLSI) circuits. In this article, we propose a novel supervised learning algorithm for SNNs based on temporal coding. A spiking neuron in this algorithm is designed to facilitate analog VLSI implementations with analog resistive memory, by which ultrahigh energy efficiency can be achieved. We also propose several techniques to improve the performance on recognition tasks and show that the classification accuracy of the proposed algorithm is as high as that of the state-of-the-art temporal coding SNN algorithms on the MNIST and Fashion-MNIST datasets. Finally, we discuss the robustness of the proposed SNNs against variations that arise from the device manufacturing process and are unavoidable in analog VLSI implementation. We also propose a technique to suppress the effects of variations in the manufacturing process on the recognition performance.

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