Substrated inhomogeneous metasurfaces analysis using interaction constant method

Inhomogeneous metasurfaces as a periodic array of supercells in which each supercell consists of different types of particles are good candidates for increasing the bandwidth in many applications. However, the presence of a substrate is often apparent in many cases; therefore, analyzing substrated inhomogeneous metasurfaces is highly attractive and important. In this paper, an efficient analysis of the plane-wave scattering by inhomogeneous substrated metasurfaces is presented using interaction constant method (ICM). In our proposed method, we calculate the total effective polarizability tensors of inhomogeneous substrated metasurfaces using both the individual polarizabilities of each particle and the closed-form interaction coefficients that relate to the interactions of the particles with each other. Since the interaction constants are calculated analytically, this method is time effective for different arrangements of particles in supercells, and with different array periods. The reflectance and transmittance of different inhomogeneous metasurfaces have been obtained and compared to full-wave simulations by a commercial EM solver, here, and this has confirmed the accuracy of the numerical results of our proposed method. Moreover, in our last example, we present a wideband terahertz absorber, and analyze its structure with our method. It seems that our proposed method is a step forward in the analysis and design of inhomogeneous substrated metasurfaces, for various applications.

Automated summary

This paper presents an efficient analysis of inhomogeneous substrated metasurfaces using the interaction constant method (ICM). The method calculates the total effective polarizability tensors of inhomogeneous substrated metasurfaces by considering the individual polarizabilities of each particle and the closed-form interaction coefficients. The accuracy of the numerical results is confirmed through comparisons with full-wave simulations. Additionally, the method is applied to the analysis of a wideband terahertz absorber.