Journal
SENSORS
Volume 22, Issue 24, Pages -Publisher
MDPI
DOI: 10.3390/s22249608
Keywords
inverted scanning microwave microscopy (iSMM); nanoscale electrical properties; graphene oxide (GO); epoxy nanocomposites
Funding
- Hygraner SRL, Italy
Ask authors/readers for more resources
In this study, the inverted near-field scanning microwave microscopy (iSMM) is used to investigate a graphene oxide-based epoxy nanocomposite material. The high-resolution spatial mapping of local conductance provides a quantitative analysis of the sample's electrical properties.
Scanning microwave microscopy (SMM) is a novel metrological tool that advances the quantitative, nanometric, high-frequency, electrical characterization of a broad range of materials of technological importance. In this work, we report an inverted near-field scanning microwave microscopy (iSMM) investigation of a graphene oxide-based epoxy nanocomposite material at a nanoscopic level. The high-resolution spatial mapping of local conductance provides a quantitative analysis of the sample's electrical properties. In particular, the electrical conductivity in the order of similar to 10-1 S/m as well as the mapping of the dielectric constant with a value of similar to 4.7 +/- 0.2 are reported and validated by the full-wave electromagnetic modeling of the tip-sample interaction.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available