4.5 Article

Topography of bent crystals with microradian resolution in one dimension

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Summary: Rocking curve topography at the Advanced Photon Source's beamline 1-BM is used to measure x-ray reflection from large flat crystals with microradian angular resolution on a sub-mm scale. While the reflection is uniform in thick, well-polished quartz wafers, it is non-uniform in thin, bendable crystals made flat by optical contact with a substrate, which are used in plasma x-ray diagnostics. Achieving desired resolution for reflection in bent crystals may require a standard microfocusing approach.

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