Topography of bent crystals with microradian resolution in one dimension

Optimum performance in x-ray imaging and spectroscopy of plasmas with bent crystals is achievable only when the crystal reflects the x rays theoretically perfectly across its entire surface. However, typical thin quartz (1011) crystal samples kept flat by direct attachment to a flat substrate reflect 8 keV x rays differently across their surface, on a scale comparable to the ideal rocking curve. Additional processing improves the uniformity. Irradiation of flat crystals with collimated, monochromatic x rays in rocking curve topography shows such problems directly, with microradian resolution. Nonuniform x-ray reflection is more difficult to document for strongly bent crystals because, then, monochromatic, collimated x rays satisfy the Bragg condition only along a narrow stripe that may be too narrow to resolve with the available cameras. However, it can be resolved with a knife edge that moves through the reflected x rays with the necessary spatial precision as demonstrated here for a bent silicon crystal. This shows qualitatively similar imperfections in the reflection as flat quartz and as the bent quartz analyzers reported on previously with lower resolution.

Automated summary

Optimum performance in x-ray imaging and spectroscopy of plasmas with bent crystals requires perfect reflection of x rays across the crystal surface. However, typical flat quartz crystal samples reflect x rays differently across their surface, and additional processing is needed to improve uniformity. Nonuniform x-ray reflection is harder to document for strongly bent crystals, but it can be resolved using a knife edge.