Related references
Note: Only part of the references are listed.Stabilization of Nb/Si nano-multilayers by B4C diffusion barriers
Manyu Wu et al.
SURFACES AND INTERFACES (2021)
X-ray photoelectron studies of near surface oxidation and plasmon excitation in spatially confined bi- and tri- layers periodic multilayer mirrors
N. Kumar et al.
THIN SOLID FILMS (2021)
Probing surfaces and interfaces in complex oxide films via in situ X-ray photoelectron spectroscopy
Suresh Thapa et al.
JOURNAL OF MATERIALS RESEARCH (2021)
Multilayer Reflective Coatings for BEUV Lithography: A Review
Paul C. Uzoma et al.
NANOMATERIALS (2021)
Beryllium-based multilayer X-ray optics
V. N. Polkovnikov et al.
PHYSICS-USPEKHI (2020)
X-ray photoelectron spectroscopy: Towards reliable binding energy referencing
G. Greczynski et al.
PROGRESS IN MATERIALS SCIENCE (2020)
Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in x-ray photoelectron spectroscopy
Cedric J. Powell
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A (2020)
Multifitting: software for the reflectometric reconstruction of multilayer nanofilms
Mikhail Svechnikov
JOURNAL OF APPLIED CRYSTALLOGRAPHY (2020)
XPS guide: Charge neutralization and binding energy referencing for insulating samples
Donald R. Baer et al.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A (2020)
Practical guides for x-ray photoelectron spectroscopy: Quantitative XPS
Alexander G. Shard
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A (2020)
Interface formation between Be and W layers depending on its thickness and ordering
Sergei S. Sakhonenkov et al.
APPLIED SURFACE SCIENCE (2020)
Study of Interfaces of Mo/Be Multilayer Mirrors Using X-ray Photoelectron Spectroscopy
Sergey A. Kasatikov et al.
JOURNAL OF PHYSICAL CHEMISTRY C (2019)
Angle resolved photoelectron spectroscopy as applied to X-ray mirrors: an in depth study of Mo/Si multilayer systems
Sergei S. Sakhonenkov et al.
PHYSICAL CHEMISTRY CHEMICAL PHYSICS (2019)
Study of oxidation processes in Mo/Be multilayers
A. N. Nechay et al.
AIP ADVANCES (2018)
Nitridated Ru/B4C multilayer mirrors with improved interface structure, zero stress, and enhanced hard X-ray reflectance
Qiushi Huang et al.
OPTICS EXPRESS (2018)
Data-reduction procedure for correction of geometric factors in the analysis of specular X-ray reflectivity of small samples
Arijeet Das et al.
JOURNAL OF APPLIED CRYSTALLOGRAPHY (2018)
High-reflection Mo/Be/Si multilayers for EUV lithography
Nikolai I. Chkhalo et al.
OPTICS LETTERS (2017)
Be/Al-based multilayer mirrors with improved reflection and spectral selectivity for solar astronomy above 17 nm wavelength
N. I. Chkhalo et al.
THIN SOLID FILMS (2017)
Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics
Qiushi Huang et al.
APPLIED PHYSICS REVIEWS (2017)
Extended model for the reconstruction of periodic multilayers from extreme ultraviolet and X-ray reflectivity data
Michael Svechnikov et al.
JOURNAL OF APPLIED CRYSTALLOGRAPHY (2017)
Advanced materials for multilayer mirrors for extreme ultraviolet solar astronomy
S. A. Bogachev et al.
APPLIED OPTICS (2016)
Aqueous solution/metal interfaces investigated in operando by photoelectron spectroscopy
O. Karslioglu et al.
FARADAY DISCUSSIONS (2015)
Aqueous solution/metal interfaces investigated in operando by photoelectron spectroscopy
O. Karslioglu et al.
FARADAY DISCUSSIONS (2015)
Long-duration plasma heating in solar microflares of X-ray class A1.0 and lower
A. S. Kirichenko et al.
ASTRONOMY LETTERS-A JOURNAL OF ASTRONOMY AND SPACE ASTROPHYSICS (2013)
Beryllium and Beryllium Oxide by XPS
Christopher F. Mallinson et al.
SURFACE SCIENCE SPECTRA (2013)
The chemical characterization and reflectivity of the Al(1.0%wtSi)/Zr periodic multilayer
Qi Zhong et al.
APPLIED SURFACE SCIENCE (2012)
Extreme-ultraviolet-induced oxidation of Mo/Si multilayers
Nicolas Benoit et al.
APPLIED OPTICS (2008)
Surface phenomena related to mirror degradation in extreme ultraviolet (EUV) lithography
Theodore E. Madey et al.
APPLIED SURFACE SCIENCE (2006)
Interface roughness in Mo/Si multilayers
I. Nedelcu et al.
THIN SOLID FILMS (2006)
Effects of interface roughness on the spectral properties of thin films and multilayers
AV Tikhonravov et al.
APPLIED OPTICS (2003)
Surface roughness and interface diffusion studies on thin Mo and W films and Mo/Si and W/Si interfaces
D Bhattacharyya et al.
APPLIED SURFACE SCIENCE (2003)
Plasmons in core-level photoemission spectra of Al(111)
C Biswas et al.
PHYSICAL REVIEW B (2003)
Calculation of electron inelastic mean free paths (IMFPs) VII. Reliability of the TPP-2M IMFP predictive equation
S Tanuma et al.
SURFACE AND INTERFACE ANALYSIS (2003)
Beryllium nitride thin film grown by reactive laser ablation
G Soto et al.
MATERIALS LETTERS (2002)
Share Paper
