4.6 Article

Out-of-plane and in-plane magnetic phases of a FeGe slab detected by dynamic cantilever magnetometry

Journal

JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 56, Issue 6, Pages -

Publisher

IOP Publishing Ltd
DOI: 10.1088/1361-6463/aca33f

Keywords

dynamic cantilever magnetometry; magnetic phases; FeGe slab; skyrmion

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Using dynamic cantilever magnetometry (DCM), the magnetic phases in H-out-of-plane and H-in-plane configurations of a FeGe slab were investigated. Two different configurations were studied: H-out-of-plane and H-in-plane. H-out-of-plane configuration showed the presence of Skyrmion phase (SkX), while H-in-plane configuration did not. The critical magnetic field for the transition from conical phase to field-polarized phase was higher in H-out-of-plane configuration compared to H-in-plane configuration. This work demonstrated the ability of DCM to probe magnetizations of thick or tilted magnetic films, which are difficult to measure using traditional microscopy techniques.
Using dynamic cantilever magnetometry (DCM), the magnetic phases in H -out-of-plane and H -in-plane configurations of a FeGe slab were investigated. We recorded magnetic field-dependent frequency shifts with static temperature (f -H measurements) and temperature-dependent frequency shifts with static magnetic field (f- T measurements). Based on these data, we constructed the H - T phase diagrams in both configurations. Skyrmion phase (SkX) can be recognized in H -out-of-plane configuration. While no signature of SkX can be recognized in H -in-plane configuration. Meanwhile, the critical magnetic field for the transition from conical phase to field-polarized phase in H -out-of-plane configuration is higher than in H -in-plane configuration. We attribute these two differences to signal-to-noise ratio and demagnetizing field in two configurations, respectively. This work demonstrated the ability of DCM to probe magnetizations of thick or tilted magnetic films, which are difficult to measure using Lorentz transmission electron microscopy or vibrating sample microscopy.

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