Localized Charge on Surfactant-Wrapped Single-Walled Carbon Nanotubes

As-synthesized, semiconducting single-walled carbon nanotubes (SWCNTs) are nominally charge neutral. However, ionic surfactants that are commonly used to disperse SWCNTs in solution can lead to significantly charged aggregates adsorbed to the nanotube. Here, electrostatic force microscopy (EFM) was used to characterize the static-charge interactions between individual SWCNTs and the local environment. We report nonuniform spatial charge distributions with highly varying magnitudes ranging between +/- 15 e associated with surfactant coverage on long SWCNTs (>1.5 mu m). EFM images acquired after resonant photoexcitation demonstrate charge carrier localization due to electrostatic interactions with charged surfactant aggregates. Charge densities as measured by EFM are used to estimate the depth of this electrostatically induced potential well, calculated to be on the order of hundreds of millielectronvolts, suggesting that surfactant charges heterogeneously covering SWCNTs provide traps for excitons potentially leading to their localization.

Automated summary

This study investigates the electrostatic interactions of single-walled carbon nanotubes using electrostatic force microscopy. The results show that surfactant coverage on long nanotubes leads to nonuniform spatial charge distributions and the potential well depth can be estimated by charge densities, suggesting the localization of excitons.