Experimental and numerical study of the emissivity of rolled aluminum

Directional spectral emissivity measurements on a rolled aluminum sheet are reported between 423 and 823 K in vacuum. The results are compared to available literature data and to theoretical predictions, revealing the crucial role of the surface state in explaining the observed scatter of values. In particular, it is argued that the cold-rolling process induces a multi-scale roughness profile that significantly enhances emission at all wavelengths, a phenomenon that can be described using rigorous coupled-wave analysis (RCWA). A small peak in the p-polarized component at oblique angles is formed by the native oxide layer. Aside from the intrinsic value of the emissivity data for the application of thermographic techniques to rolled aluminum materials, the results contained in this work also serve to validate the usefulness of RCWA to simulate the emissivities of randomly rough metal surfaces, highlighting directions of further research.

Automated summary

Directional spectral emissivity measurements were conducted on a rolled aluminum sheet in vacuum, and the results were compared to literature data and theoretical predictions. The surface state was found to play a crucial role in explaining the observed scatter of values, and the effect of the cold-rolling process on emission was studied.