4.8 Article

A Novel Detection and Localization Approach of Open-Circuit Switch Fault for the Grid-Connected Modular Multilevel Converter

Journal

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
Volume 70, Issue 1, Pages 112-124

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIE.2022.3153810

Keywords

Circuit faults; Switches; Capacitors; Location awareness; Voltage measurement; Fault detection; Current measurement; Fault detection; fault localization; modular multilevel converter (MMC); open-circuit fault; switch fault

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This article proposes a simplified and fast software-based fault detection and localization approach for the grid-connected modular multilevel converter. By calculating and comparing the errors between measured and estimated state variables, switch faults can be detected and localized. A modified Pauta criterion is used to confirm the faults. Simulation and experimental results demonstrate the effectiveness of the proposed approach.
The open-circuit fault detection and localization (FDL) technique can improve the reliability of the modular multilevel converter (MMC). However, the conventional software-based FDL methods usually have a heavy computation burden or a limited localization speed. This article proposes a simplified and fast software-based FDL approach for the grid-connected MMC. First, the errors between the measured state variables (the output current and the circulating current) and their estimated values are calculated. By comparing these errors with their threshold values, the switch fault can not only be detected but also be localized to the specific arm. Then, the capacitor voltages in this faulty arm are collected, and the submodule (SM) with the highest capacitor voltage is selected. To confirm the switch fault in this SM, a modified Pauta criterion is presented to check the abnormal voltage data. As a result, the computation burden of the proposed software-based FDL approach is significantly reduced, and the faulty SM can be localized in a short period. Simulation and experimental results verify that the proposed approach can effectively detect and localize different open-circuit faults, and it is immune to the step of power references.

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