Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 69, Issue 12, Pages 7083-7088Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2022.3211161
Keywords
Ions; Memristors; Switches; Mathematical models; Electrodes; Surface treatment; Integrated circuit modeling; Cluster decay; forgetting; ion drift; memristor; modeling; resistance switching; synaptic plasticity
Funding
- National Natural Science Foundation of China (NNSFC) [61874001, 62004001]
- University Natural Science Research Project of Anhui Province [KJ2019A0014]
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This study proposes an analysis model for memristors that captures resistance switching and synaptic behaviors by considering ion drift and cluster decay. The model successfully reproduces the characteristics and functions of actual devices. The effects of key parameters on conductive decay and resistance switching are discussed, and potential electronic applications are explored.
An important requirement for memristor applications in functional circuits is a predictable analysis model to capture the resistance switching and synaptic behaviors. Although several memristor models based on the electrochemical metallization (ECM) mechanism have been proposed, they do not match the actual memristor with a memory forgetting property caused by the spontaneous decay of metal clusters in the conductive channel. Therefore, an analytic model is developed for the memristor based on the ion drift and the cluster decay. The vertical and lateral dynamics of conductive region are described by two internal state variables, i.e., the length and the diameter. It is verified that the model with the decay effect fits well with the actual device by reproducing the I-V characteristic and the synaptic function. This model reveals that synaptic weight depends on the interval, amplitude, and duration of applied pulses. The effects of several key parameters on conductive decay and resistance switching are discussed here. The model can work in a hard-switching mode. This article describes some potential applications in electronic schemes using the model.
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