4.6 Article

Neural Network-Based I-V and C-V Modeling With High Accuracy and Potential Model Speed

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 69, Issue 11, Pages 6476-6479

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2022.3208514

Keywords

Compact model; gate-all-around field-effect-transistor (GAAFET); machine learning; neural network (NN)

Funding

  1. Berkeley Device Modeling Center, University of California at Berkeley, Berkeley, CA, USA

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This paper presents a neural network-based device modeling framework that accurately models advanced FETs. Both I-V and C-V characteristics are studied, and a speed comparison with traditional models shows the potential of neural networks in accelerating circuit simulation.
In this brief, we demonstrate a neural network (NN)-based device modeling framework. This NN model is built to model advanced field-effect transistors (FETs). Specific transfer functions and loss functions are chosen to achieve high accuracy and smoothness in the output of this NN model. Both I-V (current-voltage) and C-V (capacitance-voltage) characteristics are studied in this work. Speed comparison between the NN-based model and Berkeley short-channel IGFET model (BSIM) has been done to show that NN has a great potential to accelerate circuit simulation speed. We also present that this NN modeling framework is not only useful for more Moore technologies e.g., gate-all-around FET (GAAFET) but also beyond Moore transistors e.g., negative capacitance FET (NCFET).

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