4.7 Review

Attrition and attrition-resistance of oxygen carrier in chemical looping process - A comprehensive review

Journal

FUEL
Volume 333, Issue -, Pages -

Publisher

ELSEVIER SCI LTD
DOI: 10.1016/j.fuel.2022.126304

Keywords

Chemical looping process; Oxygen carrier; Attrition; Mechanism; Simulation

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This study provides a comprehensive review of oxygen carrier (OC) attrition in chemical looping technology, including mechanisms, measurement methods, simulation models, and methods to reduce attrition. Despite severe attrition found in many studies, there is no systematic understanding of OC attrition in the chemical looping field. Therefore, future studies should provide more complete particle parameters to construct a more comprehensive database and gain further insight into the attrition mechanism of OC.
Chemical looping technology is an innovative method for CO2 capture. Oxygen carrier (OC) is the key to the chemical looping process. The mechanical properties of OC are a major uncertainty limiting the economics of the technology. The chemical looping process usually operates as a fluidized bed, during which OC is constantly subjected to mechanical, thermal and chemical stresses, leading to severe attrition. In addition, the long oper-ating time also greatly accelerates the attrition process. This study provides a comprehensive review of OC attrition, including the parameter changes in long-term operation, mechanisms and measurement methods of attrition, models for simulation, methods to reduce attrition, and sensitivity analysis of attrition. Numerous studies have found severe OC attrition in operations. However, there is no systematic understanding of OC attrition in the chemical looping field. Therefore, in future studies, it is recommended to provide systematic and complete particle parameters to construct a more complete database. On this basis, further insight into the attrition mechanism of OC is expected to be obtained.

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