4.7 Article

Effect of the crystallographic c-axis orientation on the tribological properties of the few-layer PtSe2

Journal

APPLIED SURFACE SCIENCE
Volume 605, Issue -, Pages -

Publisher

ELSEVIER
DOI: 10.1016/j.apsusc.2022.154883

Keywords

PtSe2 Ultrathin films; Lateral force microscopy; GIWAXS Raman spectroscopy

Funding

  1. ITMS [313021T081]
  2. Research & Innovation Operational Programme - ERDF [APVV-17-0560, APVV-20-0111, APVV-19-0461, APVV-19-0365]
  3. Slovak Grant Agency for Science [VEGA 2/0059/21]
  4. EU [654360]
  5. EUROFEL project (RoadMap Esfri)

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This study compares the nanoscale tribological properties of PtSe2, a two-dimensional transition metal dichalcogenide, and finds that the c-axis orientation of PtSe2 can affect its friction coefficient and surface roughness. Alignment of PtSe2 flakes from vertical to horizontal reduces the friction coefficient, while increasing the root-mean-square surface roughness. Epitaxial PtSe2 layers show lower friction compared to other investigated films.
Two-dimensional (2D) transition metal dichalcogenides are potential candidates for ultrathin solid-state lubricants in low-dimensional systems owing to their flatness, high in-plane mechanical strength, and low shear interlayer strength. Yet, the effects of surface topography and surface chemistry on the tribological properties of 2D layers are still unclear. In this work, we performed a comparative investigation of nanoscale tribological properties of ultra-thin highly-ordered PtSe2 layers deposited on the sapphire substrates with the in-plane and out-of-plane crystallographic orientation of the PtSe2 c-axis flakes, and epitaxial PtSe2 layers. PtSe2 c-axis orientation was found to has an impact on the nanotribological, morphological and electrical properties of PtSe2, in particular the change in the alignment of the PtSe2 flakes from vertical (VA) to horizontal (HA) led to the lowering of the coefficient of friction from 0.21 to 0.16. This observation was accompanied by an increase in the root-mean-square surface roughness from 1.0 to 1.7 nm for the HA and VA films, respectively. The epitaxial films showed lower friction caused by lowering adhesion when compared to other investigated films, whereas the friction coefficient was similar to films with HA flakes. The observed trends in nanoscale friction is attributed to a different distribution of PtSe2 structure.

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