4.8 Article

Hexagonal Lu1-xInxFeO3 Room-Temperature Multiferroic Thin Films

Journal

ACS APPLIED MATERIALS & INTERFACES
Volume -, Issue -, Pages -

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsami.2c11927

Keywords

room-temperature multiferroic; hexagonal ferrites; thin films; ferroelectricity; magnetoelectric coupling

Funding

  1. National Natural Science Foundation of China
  2. National Key R&D Program of China
  3. Shenzhen Science and Technology Innovation Committee
  4. [51790493]
  5. [51961145105]
  6. [2016YFA0300101]
  7. [JCYJ20170818163902553]

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In this study, h-Lu1-xInxFeO3 thin films were successfully prepared with a stable hexagonal structure achieved at room temperature. The films exhibited high remanent polarization and excellent polarization switching performance, along with a strong magnetoelectric coupling effect. These results demonstrate the potential application of h-Lu1-xInxFeO3 thin films in magnetoelectric memory and detection devices.
The hexagonal rare earth ferrites h-RFeO3(R = rare earth element) have been recognized as promising candidates for a room-temperature multiferroic system, and the primary issue for these materials is how to get a stable hexagonal structure since the centrosymmetric orthorhombic structure is generally stable for most RFeO3 at room-temperature, while the hexagonal phase is only stable under some strict conditions. In the present work, h-Lu1-xInxFeO3 (x = 0-1) thin films were prepared on a Nb-SrTiO3 (111) single-crystal substrate by a pulsed laser deposition (PLD) process, and the multiferroic characterization was performed at room temperature. With the combined effects of chemical pressure and epitaxial strain, the stable hexagonal structure was achieved in a wide composition range (x = 0.5-0.7), and the results of XRD (X-ray diffraction) and SAED (selected area electron diffraction) indicate the super-cell match relations between the h-Lu0.3In0.7FeO3 thin film and substrate. The saturated P-E hysteresis loop was obtained at room temperature with a remanent polarization of about 4.3 mu C/cm(2), and polarization switching was also confirmed by PFM measurement. Furthermore, a strong magnetoelectric coupling with a linear magnetoelectric coefficient of 1.9 V/cm Oe was determined, which was about three orders of magnitude larger than that of h-RFeO3 ceramics. The present results indicate that the h-Lu1-xInxFeO3 thin films are expected to have great application potential for magnetoelectric memory and detection devices.

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