Plasma-Polymerized Aniline-Diphenylamine Thin Film Semiconductors

Semiconducting polymer thin films were grown by a DC plasma-polymerized technique using a mixture of aniline-diphenylamine as a precursor. FT-IR spectra were taken in order to analyze the structural properties of the resulting polymers. From morphological and structural studies performed by transmission electron microscope (TEM) and X-ray diffraction, an organized structure in plasma polymer thin films was distinguished. I-V characteristics in an asymmetric electrode configuration were studied to determine the conduction mechanism. It was found that the conduction mechanism controlled by SCLC is dominant in plasma-polymerized aniline-diphenylamine (PPAni-PDPA) thin films.

Automated summary

Semiconducting polymer thin films were successfully grown using a DC plasma-polymerized technique. The structural and morphological analysis revealed an organized structure in the plasma-polymerized thin films. The conduction mechanism in the films was found to be predominantly controlled by SCLC, as determined from the I-V characteristics.