Journal
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES
Volume 78, Issue -, Pages 482-490Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S205327332200866X
Keywords
diffraction imaging; dynamical diffraction; simulation
Categories
Funding
- ERC [804665]
- European Research Council (ERC) [804665] Funding Source: European Research Council (ERC)
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This paper presents a numerical simulation of image formation in dark-field X-ray microscopy, a diffraction-based synchrotron imaging technique capable of imaging defects in extended crystalline samples. The approach is validated by comparing simulated images with experimental data from a single crystal of diamond containing a stacking-fault defect.
Dark-field X-ray microscopy is a diffraction-based synchrotron imaging technique capable of imaging defects in the bulk of extended crystalline samples. Numerical simulations are presented of image formation in such a microscope using numerical integration of the dynamical Takagi-Taupin equations and wavefront propagation. The approach is validated by comparing simulated images with experimental data from a near-perfect single crystal of diamond containing a single stacking-fault defect in the illuminated volume.
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