4.6 Article

TCAD-Based Investigation of a 650 V 4H-SiC Trench MOSFET with a Hetero-Junction Body Diode

Journal

MICROMACHINES
Volume 13, Issue 10, Pages -

Publisher

MDPI
DOI: 10.3390/mi13101741

Keywords

silicon carbide; heterojunction diode; trench MOSFET

Funding

  1. National Natural Science Foundation of China [62174017]
  2. Natural Science Foundation Project of CQ CSTC [cstc2020jcyjmsx mX0243]
  3. National Laboratory of Science and Technology on Analog Integrated Circuit [2021-JCJQ-LB-049-7]

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In this paper, a new 650V 4H-SiC trench MOSFET with HJD and double CSLs is proposed and studied, which can suppress the turn-on of parasitic body diode, improve the transistor performance, and reduce the on-state resistance and gate-drain capacitance by using CSLs with different doping concentrations.
In this paper, a 650 V 4H-SiC trench Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) with a hetero-junction diode (HJD) and double current spreading layers (CSLs) is proposed and studied based on Sentaurus TCAD simulation. The HJD suppresses the turn-on of the parasitic body diode and improves the performance in the third quadrant. CSLs with different doping concentrations help to lower the on-state resistance as well as the gate-drain capacitance. As a result, the on-state resistance is decreased by 47.82% while the breakdown voltage remains the same and the turn-on and turn-off losses of the proposed structure are reduced by 83.39% and 68.18% respectively, compared to the conventional structure.

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