Journal
JOURNAL OF MASS SPECTROMETRY
Volume 51, Issue 12, Pages 1196-1210Publisher
WILEY
DOI: 10.1002/jms.3885
Keywords
TOF-SIMS imaging; pigments; organic matters (oils and proteins); cultural heritage; Nicolas Poussin
Funding
- Agence Nationale de la Recherche [ANR-2015-CE29-0007-01, -03 DEFIMAGE]
Ask authors/readers for more resources
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging using cluster primary ion beams is used for the identification of the pigments in the painting of Rebecca and Eliezer at the Well by Nicolas Poussin. The combination of the high mass resolution of the technique with a sub-micrometer spatial resolution offered by a delayed extraction of the secondary ions, together with the possibility to simultaneously identifying both minerals and organics, has proved to be the method of choice for the study of the stratigraphy of a paint cross section. The chemical compositions of small grains are shown with the help of a thorough processing of the data, with images of specific ions, mass spectra extracted from small regions of interest, and profiles drawn along the different painting layers. Copyright (C) 2016 John Wiley & Sons, Ltd.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available