4.7 Article

Polyamide (PA) 66 molding defect studied with optical coherence tomography (OCT) and near-infrared (NIR) spectroscopy

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PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.saa.2022.121492

Keywords

Optical coherence tomography (OCT); Near-infrared (NIR) spectroscopy; Polyamide 66; Injection molding; Two-trace (2T) two-dimensional (2D) correlation spectroscopy

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An OCT-NIRS system was developed to observe and measure the cross-sectional view and spectrum of a specific area in a polymer sample. This system enables non-invasive imaging and recording of the NIR spectrum in the observed area. It provides key information about the microscopic structure of the polymer and its relationship with the chemical composition.
An optical coherence tomography (OCT) system combined with near-infrared spectroscopy (NIRS) was developed to carry out simultaneously the cross-sectional observation and spectral measurement of a specific area inside a polymer sample. This OCT-NIRS system consists of a fiber-optic-based spectrometer combined with an OCT system and enables non-invasive imaging up to a depth of several millimeters and the recording of the NIR spectrum in the observed area. A subsequent analysis of the collected data will provide key information revealing the way in which the microscopic structure of the polymer is affected by the chemical composition around it. A structural defect inside a molded polyamide (PA) 66 sample was examined with the OCT-NIRS system to demonstrate how this technique can be utilized to characterize chemical composition as well as the morphological features inside the sample. A specific void was detected by OCT when the PA sample was molded without any drying treatment. The NIR spectrum collected around the void area of the undried PA was then compared with that of vacuum-dried PA by two-trace two-dimensional (2T2D) correlation analysis to identify a subtle but pertinent difference in the spectral features. The appearance of several correlation peaks in the 2T2D asynchronous correlation spectrum revealed that the OH group represented by the NIR band at 1446 nm is found in relative abundance around the void, which clearly reveals that the development of the void in the molded PA results from inadequate sample pretreatment.

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