4.6 Article

Label-free measurement of wall shear stress in the brain venule and arteriole using dual-wavelength third-harmonic-generation line-scanning imaging

Journal

OPTICS LETTERS
Volume 47, Issue 21, Pages 5618-5621

Publisher

Optica Publishing Group
DOI: 10.1364/OL.472136

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Funding

  1. National Natural Science Foundation of China [62075135, 61975126]
  2. Science, Technology and Innovation Commission of Shenzhen Municipality [JCYJ20190808174819083, JCYJ20190808175201640]

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In this study, we demonstrate a method for measuring instantaneous wall shear rate and WSS using dual-wavelength third-harmonic-generation (THG) line-scanning imaging. The oscillating behavior of WSS in brain venules and arterioles at micron spatial resolution is observed in a label-free manner.
Wall shear stress (WSS) is of fundamental physiological and pathological significance. Current measurement technologies suffer from poor spatial resolution or cannot measure instantaneous values in a label-free manner. Herewe demonstrate dual-wavelength third-harmonic-generation (THG) line-scanning imaging, for instantaneous wall shear rate and WSS measurement in vivo. We used the soliton selffrequency shift to generate dual-wavelength femtosecond pulses. Simultaneous acquisition of dual-wavelength THG line-scanning signals extract blood flowvelocities at adjacent radial positions for instantaneous wall shear rate and WSS measurement. Our results show the oscillating behavior of WSS in brain venules and arterioles at micron spatial resolution in a label-free manner. (c) 2022 Optica Publishing Group

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