4.4 Article

Diffracted beam interferometry - Differential phase contrast image of an amorphous thin film material

Journal

MICRON
Volume 160, Issue -, Pages -

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.micron.2022.103317

Keywords

Transmission electron microscopy; Amorphous materials; Diffracted beam interferometry; Differential phase contrast

Categories

Funding

  1. NSERC - Natural Sciences and Engineering Council of Canada
  2. CFI - Canada Foundation for Innovation
  3. BCKDF - British Columbia Knowledge Development Funds, Canada
  4. UVic's CAMTEC - Centre for Advanced Materials and Related Technology, Canada

Ask authors/readers for more resources

This article introduces the application of differential phase contrast based on diffracted beam interferometry in phase contrast imaging of amorphous thin film materials. By utilizing the Bragg diffraction effect of the Au crystal substrate and the different positions of the amorphous material on the substrate, differential phase contrast imaging of the amorphous material specimen is achieved.
Differential phase contrast based on diffracted beam interferometry is used to explain the good phase contrast found of an amorphous thin film material deposited on the surface of a gold (Au) crystal substrate. An electron biprism is used to interfere two symmetrically diffracted beams generated by the Au crystal substrate that carried the phase of the amorphous material specimen. Bragg diffraction from the Au crystal substrate is used to explain why the phase of the amorphous thin film material is so well phase imaged. The phase of the amorphous material that was deposited on the specimen's upper surface of the Au crystal substrate is canceled and thus not revealed in the phase image whereas the phase due to the amorphous material deposited on the bottom surface of the Au crystal substrate does not cancel due to having a lateral phase shift in the amorphous material specimen plane proportional to the substrate thickness and Bragg angle of the diffracted beams. The lateral phase shift enabled differential phase contrast of the amorphous material specimen.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.4
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available