Evolution of electronic band reconstruction in thickness-controlled perovskite SrRuO3 thin films

Transition metal perovskite oxides display a variety of emergent phenomena which are tunable by tailoring the oxygen octahedral rotation. SrRuO3, a ferromagnetic perovskite oxide, is well known to have various atomic structures and octahedral rotations when grown as thin films. However, how the electronic structure changes with the film thickness has been hardly studied. Here, using angle-resolved photoemission spectroscopy and electron diffraction techniques, we study the electronic structure of SrRuO3 thin films as a function of the film thickness. Different reconstructed electronic structures and spectral weights are observed for films with various thicknesses. We suggest that octahedral rotations on the surface can be qualitatively estimated via comparison of intensities of different bands. Our observation and methodology shed light on how structural variation and transition may be understood in terms of photoemission spectroscopy data.

Automated summary

Transition metal perovskite oxide SrRuO3 exhibits different reconstructed electronic structures with varying film thicknesses. The change in octahedral rotations on the surface can be qualitatively estimated by comparing spectral weights of films with different thicknesses.