Using real-time data analysis to conduct next-generation synchrotron fatigue studies

Next-generation experimental techniques, like high energy X-ray diffraction microscopy (HEDM), usher in new opportunities to collect the grain-scale data necessary for understanding the evolving processes that drive fatigue failure. In this study, we present a framework for monitoring the evolution of a deforming polycrystal, in real-time, by applying principal component analysis (PCA) to raw X-ray diffraction image data. We applied this framework to inform in-situ HEDM measurements of a cyclically loaded Inconel-718 superalloy. We discovered correlations between PCA of the diffraction data and the physical processes in the polycrystal. Lastly, we discuss extending this framework in future HEDM fatigue studies.

Automated summary

This study presents a framework for real-time monitoring of the evolution of a deforming polycrystal using principal component analysis (PCA) applied to X-ray diffraction image data. The researchers discovered correlations between PCA of the diffraction data and the physical processes in the polycrystal, which is significant for understanding fatigue failure processes.