Structural, luminescent, and morphological properties of Eu3+-doped NaTaO3 thin films grown by magnetron sputtering

Radio-frequency (RF)-sputtered Eu3+-doped NaTaO3 thin films were grown at different deposition temperatures. The X-ray diffraction patterns revealed that all thin films contained two mixed phases of NaTaO3 and Na2Ta8O21. The photoluminescence spectra of the thin films consisted of a strong orange emission (592 nm) and two weak red bands (616 nm and 689 nm), suggesting that more Eu3+ ions in the NaTaO3 host crystal were located at inversion symmetry sites. The maximum intensities of all emission peaks were achieved for the sample grown at 100 ?, in which the gravel-shaped crystallites evolved with a band gap energy of 4.61 eV, chromaticity coordinates of (0.554, 0.434), and average transmittance of 92.4%. These results indicate that the photoluminescence intensity, band gap energy, and color tunability can be achieved for RF-sputtered Eu3+-doped NaTaO3 thin films by varying the growth temperature.

Automated summary

In this study, RF-sputtered Eu3+-doped NaTaO3 thin films were grown at different deposition temperatures. The results showed that the thin films contained mixed phases of NaTaO3 and Na2Ta8O21, and the optimal photoluminescence intensity and optical properties were achieved at a specific growth temperature.